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Main¡µEquipment>STM/STS Chinese¡µ¡µ
Equipment-STM/STS

(¢¡) Ultra-Low Temperature-High Magnetic Field-Dual Tip UHV Scanning Tunneling Microscopy / Spectroscopy£¨STM / STS£©System

Persons in charge£ºXue-Jin Liang, Dong-Min Chen£¬Qi-Kun Xue

 

The system mainly consists of a changeable dual tip STM, variable temperature duwar, superconductive magnet and ultra-high vacuum system. In addition, electronic controllers, DSP data sampling/analysis and processing system, magnetic-optic and optical measurement, transport measurement and vibration-isolating system, were also developed. Compared with the low-temperature and high magnetic field STM system made by NIST, this system has the following features:
1. Independent dual tip STM with position sensor.
2. The sample can be rotated continuously with respect to magnetic field.
3. Exchangeable dual tip STM head.
4. By using optical windows, magnetic-optical measurement and characterization of optical properties of nano-structures under extreme conditions can be carried out.
5.Transport measurement can be performed. Also, specifically designed MBE chamber can be used for growth of III-V semiconductor and magnetic doping for spintronics research.

Patents

1.Xue-Jin Liang, Dong-Min Chen, Qi-Kun Xue£¬PZT steppers for scanning tunneling microscope. Application No. 200310103439.9

2.Xue-Jin Liang, Dong-Min Chen, Qi-Kun Xue£¬position sensors for the PZT steppers for scanning tunneling microscope.
Application No. 200320103121.6

3.Xue-Jin Liang, Dong-Min Chen, Qi-Kun Xue£¬PZT steppers with position sensor for scanning tunneling microscope.
Application No. 200320103120.1

4.Xue-Jin Liang, Dong-Min Chen, Qi-Kun Xue£¬digital capacitance- inductance measurement system for scanning tunneling microscope.
Application No. 200320103120.1

 

 


Contact us£ºInternational Center for Quantum Structure,CAS
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Copyright@All rights reserved.Updated in Apr.,2009